HAN, C.-F.; LIN, J.-F. The model developed for stress-induced structural phase transformations of micro-crystalline silicon films. Nano-Micro Letters, [S. l.], v. 2, n. 2, p. 68-73, 2010. DOI: 10.1007/BF03353621. Disponível em: https://nmlett.org/index.php/nml/article/view/107. Acesso em: 21 nov. 2024.