JUNG, Y.; PYUN, K. R.; YU, S.; AHN, J.; KIM, J.; PARK, J. J.; LEE, M. J.; LEE, B.; WON, D.; BANG, J.; KO, S. H. Laser-Induced Nanowire Percolation Interlocking for Ultrarobust Soft Electronics. Nano-Micro Letters, [S. l.], v. 17, p. 127, 2025. DOI: 10.1007/s40820-024-01627-7. Disponível em: https://nmlett.org/index.php/nml/article/view/1910. Acesso em: 23 feb. 2025.