HASSAN, T.; LEE, D.; NAQVI, S. M.; KIM, M.; OH, J.; PARK, S. W.; IQBAL, A.; CHO, S. Y.; HAO, Z.; HUSSAIN, N.; KHALID, Z.; ZAMAN, S.; KONG, X.; ROH, K.; KWON, H.; KOO, C. M. Quantitative Defect–Property Correlations in Ti3C2Tx MXenes via Precursor-Controlled Defect Engineering. Nano-Micro Letters, [S. l.], v. 18, p. 264, 2026. DOI: 10.1007/s40820-026-02106-x. Disponível em: https://nmlett.org/index.php/nml/article/view/2409. Acesso em: 4 mar. 2026.