Chung, Dong Seob, Tyler Davidson‑Hall, Giovanni Cotella, Quan Lyu, Peter Chun, and Hany Aziz. “Significant Lifetime Enhancement in QLEDs by Reducing Interfacial Charge Accumulation via Fluorine Incorporation in the ZnO Electron Transport Layer”. Nano-Micro Letters 14 (November 4, 2022): 212. Accessed December 22, 2024. https://nmlett.org/index.php/nml/article/view/1209.