Chung DS, Davidson‑Hall T, Cotella G, Lyu Q, Chun P, Aziz H. Significant Lifetime Enhancement in QLEDs by Reducing Interfacial Charge Accumulation via Fluorine Incorporation in the ZnO Electron Transport Layer. Nano-Micro Lett [Internet]. 2022Nov.4 [cited 2024Apr.25];14:212. Available from: https://nmlett.org/index.php/nml/article/view/1209