Graded doped structure fabricated by vacuum spray method to improve the luminance of polymer light-emitting diodes

X. Mo; T. Mizokuro; C. Heck; N. Tanigaki; T. Hiraga

doi:10.1007/BF03353600

Issue

Vol. 1 No. 1 (2009)

Issue Published : Sep 1, 2009

Graded doped structure fabricated by vacuum spray method to improve the luminance of polymer light-emitting diodes

https://doi.org/10.1007/BF03353600

X. Mo

Materials Science Department, Fudan University, 220 Handan Road, Shanghai 200433, China

T. Mizokuro

Photonics Research Institute, National Institute of Advanced Industrial Science and Technology, 1-8-31 Midorigaoka, Ikeda, Osaka 563-8577, Japan

C. Heck

Materials Science Department, Fudan University, 220 Handan Road, Shanghai 200433, China

N. Tanigaki

Materials Science Department, Fudan University, 220 Handan Road, Shanghai 200433, China

T. Hiraga

Materials Science Department, Fudan University, 220 Handan Road, Shanghai 200433, China

Corresponding Author: T. Mizokuro

chem42@ni.aist.go.jp

Nano-Micro Letters, Vol. 1 No. 1 (2009), Article Number: 19-22
Article Published : Oct 15, 2009

Abstract

An increase in luminance of a polymer light-emitting diode (PLED) was obtained by fabricating a graded doping structure using a vacuum spray method. The small electron transport molecule, Tris(8-hydroxyquinolinato) aluminum(III)(Alq₃), was graded dispersed along the film in the direction of growth in the hole transport polymer poly(3-hexylthiophene-2,5-diyl) (P3HT, regiorandom) layer of the PLED, despite being dissolved in the same organic solvent as the polymer. The PLED reported here, which is composed of a graded structure, emitted brighter light than PLEDs composed of pure polymer or of a blend of active layers prepared by spin coating and/or vacuum spray methods.

Keywords

Polymer light-emitting diodes Luminance Graded doped Vacuum spray

Mo, X., T. Mizokuro, C. Heck, N. Tanigaki, and T. Hiraga. 2009. “Graded Doped Structure Fabricated by Vacuum Spray Method to Improve the Luminance of Polymer Light-Emitting Diodes”. Nano-Micro Letters 1 (1):19-22. https://doi.org/10.1007/BF03353600.

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References

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References

J. H. Burroughes, D. D. C. Bradley, A. R. Brown, R. N. Marks, K. Mackay, R. H. Friend, P. L. Burns and A. B. Holmes, Nature (London) 347, 539 (1990). doi:10.1038/ 347539a0

Y. Xia and R. H. Friend, Appl. Phys. Lett. 88, 163508 (2006). doi:10.1063/1.2196229

S. R. Tseng, S. C. Lin, H. F. Meng, H. H. Liao, C. H. Yeh, H. C. Lai, S. F. Horng and C. S. Hsu, Appl. Phys. Lett. 88, 163501 (2006). doi:10.1063/1.2192574

Y. Shao and Y, Yang, Appl. Phys. Lett. 83, 2453 (2003). doi:10.1063/1.1605800

D. Ma, C. S. Lee, S. T. Lee and L. S. Hung, Appl. Phys. Lett. 80, 3641 (2002). doi:10.1063/1.1479450

B. D. Chin, M. C. Suh, M. -H. Kim, S. T. Lee, H. D. Kim and H. K. Chung, Appl. Phys. Lett. 86, 133505 (2005). doi:10.1063/1.1894596

A. B. Chwang, R. C. Kwong and J. J. Brown, Appl. Phys. Lett. 80, 725 (2002). doi:10.1063/1.1446992

C. W. Chen, T. Y. Cho, C. C. Wu, H. L. Yu and T. Y. Luh, Appl. Phys. Lett. 81, 1570 (2002). doi:10.1063/ 1.1502912

P. K. H. Ho, H. -S. Kim, J. H. Burroughes, H. Becker, S. F. Y. Li, T. M. Brown, F. Cacialli and R. H. Friend, Nature (London) 404, 481 (2000). doi:10.1038/35006610

T.-W. Lee, Y. Chung, O. Kwon and J.-J. Park, Adv, Funct. Mater. 17, 390 (2007). doi:10.1002/adfm.200600278

H. H. Chang, C. C. Wu, C. C. Yang, C. W. Chen and C. C. Lee, Appl. Phys. Lett. 78, 574 (2001). doi:10.1063/1.1344223

T. Hiraga, N. Tanaka, S. Takarada, K. Hayamizu, N. Kikuchi and T. Moriya, J. Vac. Sci. Technology A 12, 876 (1994). doi:10.1116/1.579270

X. L. Mo, T. Mizokuro, H. Mochizuki, N. Tanigaki and T. Hiraga, Jpn. J. Appl. Phys. 43, 307 (2004). doi:10.1143/JJAP.43.307

X. L. Mo, T. Mizokuro, A. Kobayashi, G. R. Chen, N. Tanigaki and T. Hiraga, Thin Solid Films 516, 1663 (2008). doi:10.1016/j.tsf.2007.05.013

X. L. Mo, T. Mizokuro, A. Kobayashi, G.R. Chen, H. Mochizuki, N. Tanigaki and T. Hiraga, Jpn. J. Appl. Phys. 45, 231 (2006). doi:10.1143/JJAP.45.231

X. L. Mo, T. Mizokuro, N. Tanigaki, T. Hiraga, N. Umehara, K. Takagi and S. Yamamoto, Jpn. J. Appl. Phys. 47, 425 (2008). doi:10.1143/JJAP.47.425

M. Uchida, C. Adachi, T. Koyama and Y. Taniguchi, J. Appl. Phys. 86, 1680 (1999). doi:10.1063/1.370947