Efficient CNTFET-based Ternary Full Adder Cells for Nanoelectronics
Corresponding Author: Mohammad Hossein Moaiyeri
Nano-Micro Letters,
Vol. 3 No. 1 (2011), Article Number: 43-50
Abstract
This paper presents two new efficient ternary Full Adder cells for nanoelectronics. These CNTFET-based ternary Full Adders are designed based on the unique characteristics of the CNTFET device, such as the capability of setting the desired threshold voltages by adopting proper diameters for the nanotubes as well as the same carrier mobilities for the N-type and P-type devices. These characteristics of CNTFETs make them very suitable for designing high-performance multiple-Vth structures. The proposed structures reduce the number of the transistors considerably and have very high driving capability. The presented ternary Full Adders are simulated using Synopsys HSPICE with 32 nm CNTFET technology to evaluate their performance and to confirm their correct operation.
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- Y. B. Kim, T. Elect. Electron. Mater. 11, 93 (2010). http://dx.doi.org/10.4313/TEEM.2010.11.3.093
- S. Lin, Y. B. Kim and F. Lombardi, Proc. IEEE Inter. Midwest Symp. Circuits Sys. 435 (2009).
- K. Navi, M. Rashtian, A. Khatir, P. Keshavarzian and O. Hashemipour, Springer, Nanoscale Res. Lett. 5, 859 (2010). http://dx.doi.org/10.1007/s11671-010-9575-4
- M. H. Moaiyeri, A. Doostaregan and K. Navi, to be published in IET, Circuits, Devices & Systems, (2011).
- P. Keshavarzian and K. Navi, IEICE Electron. Expr. 6, 546 (2009). http://dx.doi.org/10.1587/elex.6.546
- S. Lin, Y. B. Kim and F. Lombardi, IEEE T. Nanotechn. 10, 217 (2011).
- E. Dubrova, Proc. NORCHIP Conference, 340 (1999).
- S. L. Hurst, IEEE T. Comput. 33, 1160 (1984). http://dx.doi.org/10.1109/TC.1984.1676392
- K. Navi, M. H. Moaiyeri, R. Faghih Mirzaee, O. Hashemipour and B. Mazloom Nezhad, Elsevier, Microelectron. J. 40, 126 (2009). http://dx.doi.org/10.1016/j.mejo.2008.08.020
- S. Ijiima, Nature, 354, 56 (1991). http://dx.doi.org/10.1038/354056a0
- P. L. McEuen, M. Fuhrer and H. Park, IEEE T. Nanotechn. 1, 78 (2002).
- G. Cho, Y. B. Kim and F. Lombardi, Proc. IEEE International Instrumentation and Measurement Technology Conference 909 (2009).
- M. Budnik, A. Raychowdhury, A. Bansal and K. Roy, Proc. 43rd annual Design Automation Conference 935 (2006).
- M. Zhang, P. C. H. Chan, Y. Chai, Z. Tang, Proc. IEEE International SOI Conference 147 (2006).
- M. Jamalizadeh, F. Sharifi, M. H. Moaiyeri, K. Navi and O. Hashemipour, Nano-Micro Letters 2, 227 (2010).
- Y. Bok Kim, Y. B. Kim and F. Lombardi, Proc. IEEE International Midwest Symposium on Circuits and Systems 1130 (2009).
- A. Raychowdhury and K. Roy, IEEE T. Circuits Syst. 54, 2391 (2007). http://dx.doi.org/10.1109/TCSI.2007.907799
- A. Javey, J. Guo, D. B. Farmer, Q. Wang, E. Yenilmez, R. G. Gordon, M. Lundstrom and H. Dai, Nanoletter 4, 1319 (2004).
- A. Javey, R. Tu, D. B. Farmer, J. Guo, R. G. Gordon and H. Dai, Nanoletter 5, 345 (2005).
- A. Srivastava and K. Venkatapathy, VLSI Design 4, 75 (1996). http://dx.doi.org/10.1155/1996/94696
- J. Deng, Doctoral Dissertation, Stanford University (2007).
- J. Deng and H. S. P. Wong, IEEE T. Electron. Dev. 54, 3186 (2007). http://dx.doi.org/10.1109/TED.2007.909030
- J. Deng and H. S. P. Wong, IEEE T. Electron. Dev. 54, 3195 (2007). http://dx.doi.org/10.1109/TED.2007.909043
References
Y. B. Kim, T. Elect. Electron. Mater. 11, 93 (2010). http://dx.doi.org/10.4313/TEEM.2010.11.3.093
S. Lin, Y. B. Kim and F. Lombardi, Proc. IEEE Inter. Midwest Symp. Circuits Sys. 435 (2009).
K. Navi, M. Rashtian, A. Khatir, P. Keshavarzian and O. Hashemipour, Springer, Nanoscale Res. Lett. 5, 859 (2010). http://dx.doi.org/10.1007/s11671-010-9575-4
M. H. Moaiyeri, A. Doostaregan and K. Navi, to be published in IET, Circuits, Devices & Systems, (2011).
P. Keshavarzian and K. Navi, IEICE Electron. Expr. 6, 546 (2009). http://dx.doi.org/10.1587/elex.6.546
S. Lin, Y. B. Kim and F. Lombardi, IEEE T. Nanotechn. 10, 217 (2011).
E. Dubrova, Proc. NORCHIP Conference, 340 (1999).
S. L. Hurst, IEEE T. Comput. 33, 1160 (1984). http://dx.doi.org/10.1109/TC.1984.1676392
K. Navi, M. H. Moaiyeri, R. Faghih Mirzaee, O. Hashemipour and B. Mazloom Nezhad, Elsevier, Microelectron. J. 40, 126 (2009). http://dx.doi.org/10.1016/j.mejo.2008.08.020
S. Ijiima, Nature, 354, 56 (1991). http://dx.doi.org/10.1038/354056a0
P. L. McEuen, M. Fuhrer and H. Park, IEEE T. Nanotechn. 1, 78 (2002).
G. Cho, Y. B. Kim and F. Lombardi, Proc. IEEE International Instrumentation and Measurement Technology Conference 909 (2009).
M. Budnik, A. Raychowdhury, A. Bansal and K. Roy, Proc. 43rd annual Design Automation Conference 935 (2006).
M. Zhang, P. C. H. Chan, Y. Chai, Z. Tang, Proc. IEEE International SOI Conference 147 (2006).
M. Jamalizadeh, F. Sharifi, M. H. Moaiyeri, K. Navi and O. Hashemipour, Nano-Micro Letters 2, 227 (2010).
Y. Bok Kim, Y. B. Kim and F. Lombardi, Proc. IEEE International Midwest Symposium on Circuits and Systems 1130 (2009).
A. Raychowdhury and K. Roy, IEEE T. Circuits Syst. 54, 2391 (2007). http://dx.doi.org/10.1109/TCSI.2007.907799
A. Javey, J. Guo, D. B. Farmer, Q. Wang, E. Yenilmez, R. G. Gordon, M. Lundstrom and H. Dai, Nanoletter 4, 1319 (2004).
A. Javey, R. Tu, D. B. Farmer, J. Guo, R. G. Gordon and H. Dai, Nanoletter 5, 345 (2005).
A. Srivastava and K. Venkatapathy, VLSI Design 4, 75 (1996). http://dx.doi.org/10.1155/1996/94696
J. Deng, Doctoral Dissertation, Stanford University (2007).
J. Deng and H. S. P. Wong, IEEE T. Electron. Dev. 54, 3186 (2007). http://dx.doi.org/10.1109/TED.2007.909030
J. Deng and H. S. P. Wong, IEEE T. Electron. Dev. 54, 3195 (2007). http://dx.doi.org/10.1109/TED.2007.909043