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Vol. 6 No. 1 (2014)

Position-resolved Surface Characterization and Nanofabrication Using an Optical Microscope Combined with a Nanopipette/Quartz Tuning Fork Atomic Force Microscope

https://doi.org/10.1007/BF03353771
Sangmin An
Center for Nano-Liquid, Department of Physics and Astronomy, Seoul National University, Daehak-dong, Gwanak-gu, Seoul 151-747, South Korea
Baekman Sung
Center for Nano-Liquid, Department of Physics and Astronomy, Seoul National University, Daehak-dong, Gwanak-gu, Seoul 151-747, South Korea
Haneol Noh
Center for Nano-Liquid, Department of Physics and Astronomy, Seoul National University, Daehak-dong, Gwanak-gu, Seoul 151-747, South Korea
Corey Stambaugh
National Institute of Standards and Technology, MD 20899, USA
Soyoung Kwon
Center for Nano-Liquid, Department of Physics and Astronomy, Seoul National University, Daehak-dong, Gwanak-gu, Seoul 151-747, South Korea
Kunyoung Lee
Center for Nano-Liquid, Department of Physics and Astronomy, Seoul National University, Daehak-dong, Gwanak-gu, Seoul 151-747, South Korea
Bongsu Kim
Center for Nano-Liquid, Department of Physics and Astronomy, Seoul National University, Daehak-dong, Gwanak-gu, Seoul 151-747, South Korea
Qhwan Kim
Center for Nano-Liquid, Department of Physics and Astronomy, Seoul National University, Daehak-dong, Gwanak-gu, Seoul 151-747, South Korea
Wonho Jhe
Center for Nano-Liquid, Department of Physics and Astronomy, Seoul National University, Daehak-dong, Gwanak-gu, Seoul 151-747, South Korea

Corresponding Author: Wonho Jhe

whjhe@snu.ac.kr

Nano-Micro Letters, Vol. 6 No. 1 (2014), Article Number: 70-79

Abstract

In this work, we introduce position-resolved surface characterization and nanofabrication using an optical microscope (OM) combined with a nanopipette-based quartz tuning fork atomic force microscope (nanopipette/QTF-AFM) system. This system is used to accurately determine substrate position and nanoscale phenomena under ambient conditions. Solutions consisting of 5 nm Au nanoparticles, nanowires, and polydimethylsiloxane (PDMS) are deposited onto the substrate through the nano/microaperture of a pulled pipette. Nano/microscale patterning is performed using a nanopipette/QTF-AFM, while position is resolved by monitoring the substrate with a custom OM. With this tool, one can perform surface characterization (force spectroscopy/microscopy) using the quartz tuning fork (QTF) sensor. Nanofabrication is achieved by accurately positioning target materials on the surface, and on-demand delivery and patterning of various solutions for molecular architecture.

Keywords

Surface characterization Nanopipette QTF-AFM Optical microscope
An, Sangmin, Baekman Sung, Haneol Noh, Corey Stambaugh, Soyoung Kwon, Kunyoung Lee, Bongsu Kim, Qhwan Kim, and Wonho Jhe. 2014. “Position-Resolved Surface Characterization and Nanofabrication Using an Optical Microscope Combined With a Nanopipette/Quartz Tuning Fork Atomic Force Microscope”. Nano-Micro Letters 6 (1):70-79. https://doi.org/10.1007/BF03353771.
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